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SN65HVDA195-Q1 Datasheet, PDF (1/21 Pages) Texas Instruments – LIN AND MOST ECL PHYSICAL INTERFACE
SN65HVDA195-Q1
www.ti.com
SLLS961A – JULY 2009 – REVISED OCTOBER 2009
LIN AND MOST ECL PHYSICAL INTERFACE
Check for Samples: SN65HVDA195-Q1
FEATURES
1
• LIN Physical Layer Specification Revision 2.0
Compliant and Conforms to SAEJ2602
Recommended Practice for LIN
• LIN Bus Speed up to 20-kbps LIN Specified
Maximum and MOST ECL Speeds Down to
0 Baud
• Supports ISO9141 (K-Line)
• Qualified for Automotive Applications
• Sleep Mode: Ultra Low Current Consumption,
Allows Wake-Up Events From LIN Bus,
Wake-Up Input (External Switch), or Host
Microcontroller
• High-Speed Receive Capable
• ESD Protection to ±12 kV (Human-Body Model)
on LIN Pin
• LIN Pin Handles Voltage From –40 V to 40 V
• Survives Transient Damage in Automotive
Environment (ISO 7637)
• Extended Operation With Supply From 7 V to
27 V DC (LIN Specification 7 V to 18 V)
• Interfaces to Microcontroller With 5-V or 3.3-V
I/O Pins
• Wake-Up Request on RXD Pin
• Control of External Voltage Regulator (INH Pin)
• Integrated Pullup Resistor and Series Diode
for LIN Slave Applications
• Low Electromagnetic Emission (EME), High
Electromagnetic Immunity (EMI)
• Bus Terminal Short Circuit Protected for
Short to Battery or Short to Ground
• Thermally Protected
• Ground Disconnection Fail Safe at System
Level
• Ground Shift Operation at System Level
• Unpowered Node Does Not Disturb the
Network
FUNCTIONAL BLOCK DIAGRAM
RXD
EN
NWake
VSUP
Filter
TXD
Receiver
VSUP/2
Wake Up, State,
and INH Control
Filter
Fault
Detection
and Protection
Driver
With Slope
Control
INH
VSUP
LIN
GND
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009, Texas Instruments Incorporated