SN65HVDA100-Q1 Datasheet, PDF (1/26 Pages) Texas Instruments – LIN PHYSICAL INTERFACE

SN65HVDA100-Q1
www.ti.com
LIN PHYSICAL INTERFACE
Check for Samples: SN65HVDA100-Q1
SLIS128 – NOVEMBER 2011
FEATURES
1
• Qualified for Automotive Applications
• Local Interconnect Network (LIN) Physical
Layer Specification Revision 2.1 Compliant
and Conforms to SAEJ2602 Recommended
Practice for LIN
• Extended Operation With Supply From 5 V to
27 V DC (LIN Specification 7 V to 18 V)
• LIN Transmit Speed up to 20-kbps LIN
Specified Maximum, High Speed Receive
Capable
• Sleep Mode: Ultra-low Current Consumption
Allows Wake-Up Events From: LIN Bus,
Wake-Up Input (External Switch) or Host MCU
• Wake-Up Request on RXD Pin
• Wake-Up Source Recognition on TXD Pin
• Interfaces to MCU With 5-V or 3.3-V I/O Pins
• High Electromagnetic Compatibility (EMC)
• Control of External Voltage Regulator (INH Pin)
• Supports ISO9141 (K-Line) Like Functions
• Protection
• ESD Protection to ±12 kV (Human-Body Model)
on LIN Pin
• LIN Pin Handles Voltage From –27 V to 45 V
(Short to Battery or Ground)
• Survives Transient Damage in Automotive
Environment (ISO 7637)
• Undervoltage protection on V_SUP
• TXD Dominant State Timeout Protection
• Prevention of False Wake Ups with Bus Stuck
Dominant Fault
• Thermal Shut Down
• Unpowered Node or Ground Disconnection
Failsafe at System Level, Node Does Not
Disturb Bus (No load on bus)
RXD
EN
NWake
FUNCTIONAL BLOCK DIAGRAM
V_SUP
Receiver
V_SUP/2
INH
V_SUP
V_SUP
Filter
Wake Up, State,
and INH Control
Filter
Fault
Detection
and Protection
30 kW
LIN
TXD
Dominant
State
Timeout
Driver
With Slope
Control
GND
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2011, Texas Instruments Incorporated