SN64BCT25244_15 Datasheet, PDF (1/8 Pages) Texas Instruments – 25-ohm OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS

• State-of-the-Art BiCMOS Design
Significantly Reduces I_CCZ
• High-Impedance State During Power Up and
Power Down
• ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015; Exceeds
200 V Using Machine Model (C = 200 pF,
R = 0)
• Designed to Facilitate Incident-Wave
Switching for Line Impedances of 25 Ω or
Greater
• Distributed V_CC and GND Pins Minimize
Noise Generated by the Simultaneous
Switching of Outputs
• Package Options Include Plastic
Small-Outline (DW) Packages and Standard
Plastic 300-mil DIPs (NT)
SN64BCT25244
25ĆΩ OCTAL BUFFER/DRIVER
WITH 3ĆSTATE OUTPUTS
SCBS477 − DECEMBER 1992 − REVISED JANUARY 1994
DW OR NT PACKAGE
(TOP VIEW)
1Y1 1
GND 2
1Y2 3
1Y3 4
GND 5
1Y4 6
2Y1 7
GND 8
2Y2 9
2Y3 10
GND 11
2Y4 12
24 1OE
23 1A1
22 1A2
21 V_CC
20 1A3
19 1A4
18 2A1
17 2A2
16 V_CC
15 2A3
14 2A4
13 2OE
description
The SN64BCT25244 is a 25-Ω octal buffer and line driver designed specifically to improve both the performance
and density of 3-state memory address drivers, clock drivers, and bus-oriented transceivers.
When the output-enable (1OE and 2OE) inputs are low, the device transmits data from the A inputs to the
Y outputs. When 1OE and 2OE are high, the outputs are in the high-impedance state.
This buffer/driver is capable of sinking 188-mA I_OL, which facilitates switching 25-Ω transmission lines on the
incident wave. The distributed V_CC and GND pins minimize switching noise for more reliable system operation.
The outputs are in a high-impedance state during power up and power down while the supply voltage value is
less than approximately 3 V.
The SN64BCT25244 is characterized for operation from − 40°C to 85°C and 0°C to 70°C.
FUNCTION TABLE
(each buffer/driver)
INPUTS
OE
A
OUTPUT
Y
L
H
H
L
L
L
H
X
Z
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1994, Texas Instruments Incorporated
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