SN54LVT18502_08 Datasheet, PDF (1/31 Pages) Texas Instruments – 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

SN54LVT18502
3.3-V ABT SCAN TEST DEVICE
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS669 – JULY 1996
D Member of the Texas Instruments SCOPE ™
Family of Testability Products
D Member of the Texas Instruments
Widebus ™ Family
D State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V_CC)
D Supports Unregulated Battery Operation
Down to 2.7 V
D UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
D Packaged in 68-Pin Ceramic Quad Flat (HV)
Packages Using 25-mil Center-to-Center
Spacings
HV PACKAGE
(TOP VIEW)
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V_CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61
10
60
11
59
12
58
13
57
14
56
15
55
16
54
17
53
18
52
19
51
20
50
21
49
22
48
23
47
24
46
25
45
26
44
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
1B4
1B5
1B6
GND
1B7
1B8
1B9
V_CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
NC – No internal connection
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
1