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SN54HCT08_15 Datasheet, PDF (1/16 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-AND GATES
D Operating Voltage Range of 4.5 V to 5.5 V
D Outputs Can Drive Up To 10 LSTTL Loads
D Low Power Consumption, 20-µA Max ICC
SN54HCT08 . . . J OR W PACKAGE
SN74HCT08 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 VCC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
SN54HCT08, SN74HCT08
QUADRUPLE 2-INPUT POSITIVE-AND GATES
SCLS063D – NOVEMBER 1988 – REVISED AUIGUST 2003
D Typical tpd = 13 ns
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 µA Max
D Inputs Are TTL-Voltage Compatible
SN54HCT08 . . . FK PACKAGE
(TOP VIEW)
1Y
3 2 1 20 19
4
18
4A
NC 5
17 NC
2A 6
16 4Y
NC 7
15 NC
2B 8
14 3B
9 10 11 12 13
NC – No internal connection
description/ordering information
These devices contain four independent 2-input AND gates. They perform the Boolean function
+ + ) Y A • B or Y A B in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – N
Tube of 25
SN74HCT08N
SN74HCT08N
Tube of 50
SN74HCT08D
SOIC – D
Reel of 2500 SN74HCT08DR
HCT08
–40°C to 85°C SOP – NS
Reel of 250
Reel of 2000
SN74HCT08DT
SN74HCT08NSR
HCT08
SSOP – DB
Reel of 2000 SN74HCT08DBR
HT08
Tube of 90
SN74HCT08PW
TSSOP – PW
Reel of 2000 SN74HCT08PWR
HT08
Reel of 250
SN74HCT08PWT
CDIP – J
Tube of 25
SNJ54HCT08J
SNJ54HCT08J
–55°C to 125°C CFP – W
Tube of 150
SNJ54HCT08W
SNJ54HCT08W
LCCC – FK
Tube of 55
SNJ54HCT08FK
SNJ54HCT08FK
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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Copyright  2003, Texas Instruments Incorporated
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