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SN54HCT02_15 Datasheet, PDF (1/15 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-NOR GATES
D Operating Voltage Range of 4.5 V to 5.5 V
D Outputs Can Drive Up To 10 LSTTL Loads
D Low Power Consumption, 20-µA Max ICC
SN54HCT02 . . . J OR W PACKAGE
SN74HCT02 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1Y 1
1A 2
1B 3
2Y 4
2A 5
2B 6
GND 7
14 VCC
13 4Y
12 4B
11 4A
10 3Y
9 3B
8 3A
SN54HCT02, SN74HCT02
QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SCLS065E – NOVEMBER 1988 – REVISED JULY 2003
D Typical tpd = 10 ns
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 µA Max
D Inputs Are TTL-Voltage Compatible
SN54HCT02 . . . FK PACKAGE
(TOP VIEW)
1B
3 2 1 20 19
4
18
4B
NC 5
17 NC
2Y 6
16 4A
NC 7
15 NC
2A 8
14 3Y
9 10 11 12 13
NC – No internal connection
description/ordering information
These devices contain four independent 2-input NOR gates. They perform the Boolean function Y = A • B or
Y = A + B in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – N
Tube of 25
SN74HCT02N
SN74HCT02N
Tube of 50
SN74HCT02D
SOIC – D
Reel of 2500 SN74HCT02DR
HCT02
Reel of 250
SN74HCT02DT
–40°C to 85°C SOP – NS
Reel of 2000 SN74HCT02NSR
HCT02
SSOP – DB
Reel of 2000 SN74HCT02DBR
HT02
Tube of 90
SN74HCT02PW
TSSOP – PW
Reel of 2000 SN74HCT02PWR
HT02
Reel of 250
SN74HCT02PWT
CDIP – J
–55°C to 125°C CFP – W
Tube of 25
Tube of 150
SNJ54HCT02J
SNJ54HCT02W
SNJ54HCT02J
SNJ54HCT02W
LCCC – FK
Tube of 55
SNJ54HCT02FK
SNJ54HCT02FK
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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Copyright  2003, Texas Instruments Incorporated
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