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SN54HCT00_15 Datasheet, PDF (1/16 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-NAND GATES
D Operating Voltage Range of 4.5 V to 5.5 V
D Outputs Can Drive Up To 10 LSTTL Loads
D Low Power Consumption, 20-µA Max ICC
SN54HCT00 . . . J OR W PACKAGE
SN74HCT00 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 VCC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
SN54HCT00, SN74HCT00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SCLS062D – NOVEMBER 1988 – REVISED AUGUST 2003
D Typical tpd = 10 ns
D ±4-mA Output Drive at 5 V
D Low Input Current of 1 µA Max
D Inputs Are TTL-Voltage Compatible
SN54HCT00 . . . FK PACKAGE
(TOP VIEW)
1Y
3 2 1 20 19
4
18
4A
NC 5
17 NC
2A 6
16 4Y
NC 7
15 NC
2B 8
14 3B
9 10 11 12 13
description/ordering information
NC – No internal connection
These devices contain four independent 2-input NAND gates. They perform the Boolean function Y = A • B or
Y = A + B in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – N
Tube of 25
SN74HCT00N
SN74HCT00N
Tube of 50
SN74HCT00D
SOIC – D
Reel of 2500 SN74HCT00DR
HCT00
Reel of 250
SN74HCT00DT
–40°C to 85°C SOP – NS
Reel of 2000 SN74HCT00NSR
HCT00
SSOP – DB
Reel of 2000 SN74HCT00DBR
HT00
Tube of 90
SN74HCT00PW
TSSOP – PW
Reel of 2000 SN74HCT00PWR
HT00
Reel of 250
SN74HCT00PWT
CDIP – J
–55°C to 125°C CFP – W
Tube of 25
Tube of 150
SNJ54HCT00J
SNJ54HCT00W
SNJ54HCT00J
SNJ54HCT00W
LCCC – FK
Tube of 55
SNJ54HCT00FK
SNJ54HCT00FK
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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Copyright  2003, Texas Instruments Incorporated
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