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SN54HC273-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES
SN54HC273-DIE
www.ti.com
SCLS735 – JUNE 2013
RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES
Check for Samples: SN54HC273-DIE
FEATURES
1
• Wide Operating Voltage Range
• Outputs Can Drive Up To 10 LSTTL Loads
• Low Power Consumption
• Typical tpd = 12 ns
• Low Input Current
• Contain Eight Flip-Flops With Single-Rail Outputs
• Direct Clear Input
• Applications Include:
– Buffer/Storage Registers
– Shift Registers
– Pattern Generators
DESCRIPTION
Information at the data (D) inputs meeting the setup time requirements is transferred to the Q outputs on the
positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a particular voltage level and is not
related directly to the transition time of the positive-going pulse. When CLK is at either the high or low level, the
D input has no effect at the output.
Table 1. FUNCTION TABLE
(each flip-flop)
INPUTS
OUPUT
CLR CLK
D
Q
L
X
X
L
H
↑
H
H
H
↑
L
L
H
L
X
Q0
PRODUCT
SN54HC273V
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION(1)
PACKAGE
ORDERABLE PART NUMBER
Bare die in waffle pack(2)
SN54HC273VTDG1
SN54HC273VTDG2
PACKAGE QUANTITY
100
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.