SN54HC08-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES

SN54HC08-DIE
www.ti.com
SCLS734 – JUNE 2013
RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES
Check for Samples: SN54HC08-DIE
FEATURES
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• Wide Operating Voltage Range
• Outputs Can Drive Up To 10 LSTTL Loads
• Low Power Consumption
• Typical t_pd = 8 ns
• Low Input Current
DESCRIPTION
The SN54HC08-DIE device contains four independent 2-input AND gates. Each gate performs the Boolean
function of Y = A • B or Y = A + B in positive logic.
PRODUCT
SN54HC08V
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER
Bare die in waffle pack⁽²⁾
SN54HC08VTDF1
SN54HC08VTDF2
PACKAGE QUANTITY
100
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.