SN54ALS257A_15 Datasheet, PDF (1/20 Pages) Texas Instruments – QUADRUPLE 2-LINE TO 1-LINE DATA SELECTORS/MULTIPLEXERS WITH 3-STATE OUTPUTS

SN54ALS257A, SN54ALS258A, SN74ALS257A, SN74ALS258A, SN74AS257, SN74AS258
QUADRUPLE 2ĆLINE TO 1ĆLINE DATA SELECTORS/MULTIPLEXERS
WITH 3ĆSTATE OUTPUTS
SDAS124C − APRIL 1982 − REVISED AUGUST 1996
D 3-State Outputs Interface Directly With
System Bus
D Provide Bus Interface From Multiple
Sources in High-Performance Systems
D Package Options Include Plastic
Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These data selectors/multiplexers are designed
to multiplex signals from 4-bit data sources to
4-output data lines in bus-organized systems. The
3-state outputs do not load the data lines when the
output-enable (OE) input is at a high logic level.
SN54ALS257A, SN54ALS258A . . . J PACKAGE
SN74ALS257A, SN74ALS258A, SN74AS257,
SN74AS258 . . . D OR N PACKAGE
(TOP VIEW)
A/B 1
1A 2
1B 3
1Y 4
2A 5
2B 6
2Y 7
GND 8
16 V_CC
15 OE
14 4A
13 4B
12 4Y
11 3A
10 3B
9 3Y
SN54ALS257A, SN54ALS258A . . . FK PACKAGE
(TOP VIEW)
The SN54ALS257A and SN54ALS258A are
characterized for operation over the full military
temperature range of −55°C to 125°C. The
SN74ALS257A, SN74ALS258A, SN74AS257,
and SN74AS258 are characterized for operation
from 0°C to 70°C.
1B
3 2 1 20 19
4
18
4A
1Y ₅
17 ^4B
NC 6
16 NC
2A 7
15 4Y
2B 8
14 3A
9 10 11 12 13
NC − No internal connection
FUNCTION TABLE
INPUTS
OUTPUT Y
OE A /B
DATA
AB
SN54ALS257A
SN74ALS257A
SN74AS257
SN54ALS258A
SN74ALS258A
SN74AS258
HXXX
Z
Z
LLLX
L
H
L LHX
H
L
L HX L
L
H
LHXH
H
L
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1996, Texas Instruments Incorporated
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