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SN54AHCT540_15 Datasheet, PDF (1/23 Pages) Texas Instruments – OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
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SN54AHCT540
SN74AHCT540
SCLS268M – OCTOBER 1995 – REVISED JUNE 2013
OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
Check for Samples: SN54AHCT540, SN74AHCT540
FEATURES
1
• Inputs Are TTL-Voltage Compatible
• Latch-Up Performance Exceeds 250 mA Per
JESD 17
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
DESCRIPTION
The ’AHCT540 octal buffers/drivers are ideal for
driving bus lines or buffer memory address registers.
These devices feature inputs and outputs on opposite
sides of the package to facilitate printed circuit board
layout.
The 3-state control gate is a two-input AND gate with
active-low inputs so that if either output-enable (OE1
or OE2) input is high, all corresponding outputs are in
the high-impedance state. The outputs provide
inverted data when they are not in the high-
impedance state.
To ensure the high-impedance state during power up
or power down, OE should be tied to VCC through a
pullup resistor; the minimum value of the resistor is
determined by the current-sinking capability of the
driver.
SN54AHCT540 . . . J OR W PACKAGE
SN74AHCT540 . . . DB, DGV, DW, N, NS, OR PW PACKAGE
(TOP VIEW)
OE1 1
A1 2
A2 3
A3 4
A4 5
A5 6
A6 7
A7 8
A8 9
GND 10
20 VCC
19 OE2
18 Y1
17 Y2
16 Y3
15 Y4
14 Y5
13 Y6
12 Y7
11 Y8
SN54AHCT540 . . . FK PACKAGE
(TOP VIEW)
3 2 1 20 19
A3 4
18 Y1
A4 5
17 Y2
A5 6
16 Y3
A6 7
15 Y4
A7 8
14 Y5
9 10 11 12 13
FUNCTION TABLE
(EACH BUFFER/DRIVER)
INPUTS
OUTPUT
OE1
OE2
A
Y
L
L
L
H
L
L
H
L
H
X
X
Z
X
H
X
Z
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1995–2013, Texas Instruments Incorporated