SN54AC02-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN54AC02-DIE
www.ti.com
SCHS392 – MAY 2013
RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-NOR GATES
Check for Samples: SN54AC02-DIE
FEATURES
1
• AC Types Feature 1.5-V to 5.5-V Operation
• Rad-Tolerant: 50 KRad(Si) TID ⁽¹⁾
(1) Radiation tolerance is a typical value based upon initial device
qualification. Radiation Lot Acceptance Testing is available -
contact factory for details.
– TID Dose Rate < 2 mRad/sec
DESCRIPTION
The SN54AC02-DIE device contains four independent 2-input NOR gates that perform the Boolean function
Y = A • B or Y = A + B in positive logic.
PRODUCT
SN54AC02
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
Bare die in waffle pack⁽²⁾
SN54AC02VTD1
100
SN54AC02VTD2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated