SN54AC00-SP_016 Datasheet, PDF (1/10 Pages) Texas Instruments – SN54AC00-SP Radiation Hardened Quad 2 Input NAND Gate

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SN54AC00-SP
SCHS367B – OCTOBER 2008 – REVISED FEBRUARY 2015
SN54AC00-SP Radiation Hardened Quad 2 Input NAND Gate
1 Features
•1 5962R87549:
– Radiation Hardness Assurance (RHA) up to
TID 100 krad (Si)
– SEL/SEU Immune to 86 MeV
• 5962-87549:
– Total Ionizing Dose 50 krad (Si)
• 2-V to 6-V V_CC Operation
• Inputs Accept Voltages to 6 V
• Max t_pd of 7 ns at 5 V
2 Applications
• Satellite Payloads
• Satellite Power on Reset Logic
• RHA Known Good Die (KGD) Offering for Space
Hybrids
Pin Functions (Each Gate)
INPUTS
A
B
OUTPUT
Y
H
H
L
L
X
H
Logic Diagram (Positive Logic)
A
Y
B
3 Description
The SN54AC00 device contains four independent 2-
input NAND gates. Each gate performs the Boolean
function of Y = A • B or Y = A + B in positive logic.
Device Information⁽¹⁾
PART NUMBER
PACKAGE
BODY SIZE (NOM)
CDIP (14)
5.97 mm × 9.21 mm
SN54AC00-SP
CFP (14)
6.67 mm × 19.56 mm
KGD (0)
Not applicable
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
SPACER
J OR W PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 V_CC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.