SN54ABTH32316_16 Datasheet, PDF (1/13 Pages) Texas Instruments – 16-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS

SN54ABTH32316, SN74ABTH32316
16-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
D Members of the Texas Instruments
Widebus+™ Family
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D UBE ™ (Universal Bus Exchanger)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, Clocked, or Clock-Enabled Mode
D ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015
D Latch-Up Performance Exceeds 500 mA
Per JEDEC Standard JESD-17
D Typical V_OLP (Output Ground Bounce)
< 0.8 V at V_CC = 5 V, T_A = 25°C
SCBS179E – JUNE 1992 – REVISED MAY 1997
D High-Impedance State During Power Up
and Power Down
D Distributed V_CC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D High-Drive Outputs (–32-mA I_OH, 64-mA I_OL)
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D Package Options Include 80-Pin Plastic
Thin Quad Flat (PN) Package With
12 × 12-mm Body Using 0.5-mm Lead Pitch
and 84-Pin Ceramic Quad Flat (HT) Package
’ABTH32316 . . . PN PACKAGE
(TOP VIEW)
A2
A3
A4
GND
A5
A6
A7
A8
A9
V_CC
GND
A10
A11
A12
A13
A14
GND
A15
A16
NC
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61
1
60
2
59
3
58
4
57
5
56
6
55
7
54
8
53
9
52
10
51
11
50
12
49
13
48
14
47
15
46
16
45
17
44
18
43
19
42
20
41
21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40
C8
C7
C6
GND
C5
C4
C3
C2
C1
V_CC
GND
B16
B15
B14
B13
B12
GND
B11
B10
B9
NC – No internal connection
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus+, EPIC-ΙΙB, and UBE are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1997, Texas Instruments Incorporated
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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