SN54ABT8543_15 Datasheet, PDF (1/31 Pages) Texas Instruments – SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D Functionally Equivalent to ’F543 and
’ABT543 in the Normal-Function Mode
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
D Two Boundary-Scan Cells Per I/O for
Greater Flexibility
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic
DIPs (JT)
description
The ’ABT8543 scan test devices with octal
registered bus transceivers are members of the
Texas Instruments SCOPE™ testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
SN54ABT8543 . . . JT PACKAGE
SN74ABT8543 . . . DL OR DW PACKAGE
(TOP VIEW)
LEAB 1
CEAB 2
OEAB 3
A1 4
A2 5
A3 6
GND 7
A4 8
A5 9
A6 10
A7 11
A8 12
TDO 13
TMS 14
28 LEBA
27 CEBA
26 OEBA
25 B1
24 B2
23 B3
22 B4
21 V_CC
20 B5
19 B6
18 B7
17 B8
16 TDI
15 TCK
SN54ABT8543 . . . FK PACKAGE
(TOP VIEW)
OEBA
CEBA
LEBA
LEAB
CEAB
OEAB
A1
4 3 2 1 28 27 26
5
25
6
24
7
23
8
22
9
21
10
20
11
19
12 13 14 15 16 17 18
B7
B8
TDI
TCK
TMS
TDO
A8
In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus
transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at
the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not
affect the functional operation of the SCOPE™ octal registered bus transceivers.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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