SCAN928028 Datasheet, PDF (1/23 Pages) National Semiconductor (TI) – 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST

SCAN928028
www.ti.com
SNLS163F – AUGUST 2003 – REVISED APRIL 2013
SCAN928028 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST
Check for Samples: SCAN928028
FEATURES
1
•2 IEEE 1149.1 (JTAG) Compliant and At-Speed
BIST Test Mode.
• All 8 Channels Synchronous to One Parallel
Clock Rate, from 18 to 66 MHz
• Duplicates Function of Multiple DS92LV1021
and '1023 10-Bit Serializer Devices
• Serializes from One to Eight 10-Bit Parallel
Inputs into Data Streams with Embedded
Clock
• Eight 5 mA Modified Bus LVDS Outputs that
are Capable to Drive Double Terminations
• @Speed Test - PRBS Generation to Check
LVDS Transmission Path to SCAN921224,
SCAN921226, SCAN921260, or SCAN926260
• On Chip Filtering for PLL
• 740mW Typ Power Dissipation (Loaded, PRBS,
66MHz, 3.3V)
• High Impedance Inputs and Outputs on Power
off
• Single Power Supply at +3.3V (+/-10%)
• 196-pin NFBGA Package
• Industrial Temperature Range Operation: -40
to +85°C
DESCRIPTION
The SCAN928028 integrates eight serializer devices
into a single chip. The SCAN928028 can
simultaneously serialize up to eight 10-bit data
streams. The 10-bit parallel inputs are LVTTL signal
levels. The serialized outputs are LVDS signals with
extra drive current for point-to-point and lightly loaded
multidrop applications. Each serializer block in the
SCAN928028 operates independently by using
strobes from a single shared PLL.
The SCAN928028 uses a single +3.3V power supply
with a typical power dissipation of 740mW (3.3V /
PRBS / 66 MHz). Each serializer channel has a
unique power down control to further conserve power
consumption.
For high-speed LVDS serial data transmission, line
quality is essential, thus the SCAN928028 includes
an @SPEED TEST function. Each Serializer channel
has the ability to internally generate a PRBS data
pattern. This pattern is received by specific
deserializers (SCAN921224) which have the
complement PRBS verification circuit. The
deserializer checks the data pattern for bit errors and
reports any errors on the test verification pins on the
deserializer.
For additional information - please see the Application
Information section in this datasheet.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2013, Texas Instruments Incorporated