SCAN921260 Datasheet, PDF (1/22 Pages) National Semiconductor (TI) – X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST

SCAN921260
www.ti.com
SNLS139F – DECEMBER 2001 – REVISED APRIL 2013
SCAN921260 X6 1:10 Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST
Check for Samples: SCAN921260
FEATURES
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•2 IEEE 1149.1 (JTAG) Compliant and At-Speed
BIST Test Modes
• Deserializes One to Six BusLVDS Input Serial
Data Streams With Embedded Clocks
• Seven Selectable Serial Inputs to Support N+1
Redundancy of Deserialized Streams
• Seventh Channel Has Single Pin Monitor
Output That Reflects Input From Seventh
Channel Input
• Parallel Clock Rate Up To 66 MHz
• On Chip Filtering for PLL
• High Impedance Inputs Upon Power Off (V_cc =
0V)
• Single Power Supply at +3.3V
• 196-Pin NFBGA Package (Low-Profile Ball Grid
Array) Package
• Industrial Temperature Range Operation: −40
to +85
DESCRIPTION
The SCAN921260 integrates six deserializer devices
into a single chip. The SCAN921260 can
simultaneously deserialize up to six data streams that
have been serialized by the Texas Instruments
SCAN921023 Bus LVDS serializer. The device also
includes a seventh serial input channel that serves as
a redundant input.
Each deserializer block in the SCAN921260 operates
independently with its own clock recovery circuitry
and lock-detect signaling.
The SCAN921260 uses a single +3.3V power supply
with an estimated power dissipation of 1.2W at 3.3V
with a PRBS-15 pattern. Refer to the Connection
Diagrams for packaging information.
Functional Block Diagram
Figure 1. Typical Application
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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