SCAN25100_16 Datasheet, PDF (1/38 Pages) Texas Instruments – SCAN25100 2457.6, 1228.8, and 614.4 Mbps CPRI SerDes with Auto RE Sync and Precision Delay Calibration Measurement

SCAN25100
www.ti.com
SNLS223C – SEPTEMBER 2006 – REVISED APRIL 2013
SCAN25100 2457.6, 1228.8, and 614.4 Mbps CPRI SerDes with Auto RE Sync and
Precision Delay Calibration Measurement
Check for Samples: SCAN25100
FEATURES
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•2 Exceeds LV and HV CPRI Voltage and Jitter
Requirements
• 2457.6, 1228.8, and 614.4 Mbps Operation
• Integrated Delay Calibration Measurement
(DCM) Directly Measures T14 and Toffset
Delays to ≤ ± 800 ps
• DCM Also Measures Chip and Other Delays to
≤ ± 1200 ps Accuracy
• Deterministic Chip Latency
• Independent Transmit and Receive PLLs for
Seamless RE Synchronization
• Low Noise Recovered Clock Output
• Requires No Jitter Cleaning in Single-Hop
Applications
• >8 kV ESD on the CML IO, >7 kV on All Other
Pins, >2 kV CDM
• Hot Plug Protection
• LOS, LOF, 8b/10b Line Code Violation,
Comma, and Receiver PLL Lock Reporting
• Programmable Hyperframe Length and Start of
Hyperframe Character
• Programmable Transmit De-Emphasis and
Receive Equalization With On-Chip
Termination
• Advanced Testability Features
– IEEE 1149.1 and 1149.6
– At-Speed BIST Pattern Generator/Verifier
– Multiple Loopback Modes
• 1.8V or 3.3V Compatible Parallel Bus Interface
• 100-pin HTQFP Package with Exposed Dap
• Industrial –40 to +85° C Temperature Range
DESCRIPTION
The SCAN25100 is a 2457.6, 1228.8, and 614.4
Mbps serializer/deseralizer (SerDes) for high-speed
bidirectional serial data transmission over FR-4
printed circuit board backplanes, balanced cables,
and optical fiber. The SCAN25100 integrates
precision delay calibration measurement (DCM)
circuitry that measures link delay components to
better than ± 800 ps accuracy.
The SCAN25100 features independent transmit and
receive PLLs, on-chip oscillator, and intelligent clock
management circuitry to automatically perform
remote radio head synchronization and reduce the
cost and complexity of external clock networks.
The SCAN25100 is programmable though an MDIO
interface as well as through pins, featuring
configurable transmitter de-emphasis, receiver
equalization, speed rate selection, internal pattern
generation/verification, and loop back modes. In
addition to at-speed BIST, the SCAN25100 includes
IEEE 1149.1 and 1149.6 testability.
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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