SCAN15MB200_15 Datasheet, PDF (1/20 Pages) Texas Instruments – Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6

SCAN15MB200
www.ti.com
SNLS188E – NOVEMBER 2005 – REVISED APRIL 2013
Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6
Check for Samples: SCAN15MB200
FEATURES
1
•2 1.5 Gbps Data Rate Per Channel
• Configurable Off/On Pre-emphasis Drives
Lossy Backplanes and Cables
• LVDS/BLVDS/CML/LVPECL Compatible Inputs,
LVDS Compatible Outputs
• Low Output Skew and Jitter
• On-chip 100Ω Input and Output Termination
• IEEE 1149.1 and 1149.6 Compliant
• 15 kV ESD Protection on LVDS Inputs/Outputs
• Hot Plug Protection
• Single 3.3V Supply
• Industrial -40 to +85°C Temperature Range
• 48-Pin WQFN Package
DESCRIPTION
The SCAN15MB200 is a dual-port 2 to 1 multiplexer
and 1 to 2 repeater/buffer. High-speed data paths
and flow-through pinout minimize internal device jitter
and simplify board layout, while pre-emphasis
overcomes ISI jitter effects from lossy backplanes
and cables. The differential inputs and outputs
interface to LVDS or Bus LVDS signals such as those
on TI's 10-, 16-, and 18- bit Bus LVDS SerDes, or to
CML or LVPECL signals.
Integrated IEEE 1149.1 (JTAG) and 1149.6 circuitry
supports testability of both single-ended
LVTTL/CMOS and high-speed differential PCB
interconnects. The 3.3V supply, CMOS process, and
robust I/O ensure high performance at low power
over the entire industrial -40 to +85°C temperature
range.
Typical Application
Switch
Fabric A
Switch
Fabric B
Mux Buffer
FPGA
or
ASIC
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2013, Texas Instruments Incorporated