REF5025-HT_14 Datasheet, PDF (1/17 Pages) Texas Instruments – LOW NOISE, VERY LOW DRIFT, PRECISION VOLTAGE REFERENCE

REF5025-HT
www.ti.com
SBOS502E – SEPTEMBER 2009 – REVISED NOVEMBER 2013
LOW NOISE, VERY LOW DRIFT, PRECISION VOLTAGE REFERENCE
Check for Samples: REF5025-HT
FEATURES
1
•2 Low Temperature Drift: 40 ppm/°C
• Low Noise: 3 μV_PP/V
• High Output Current: ±7 mA
APPLICATIONS
• Down-Hole Drilling
• High Temperature Environments
SUPPORTS EXTREME TEMPERATURE
APPLICATIONS
• Controlled Baseline
• One Assembly/Test Site
• One Fabrication Site
• Available in Extreme (–55°C/210°C)
Temperature Range ⁽¹⁾
• Extended Product Life Cycle
• Extended Product-Change Notification
• Product Traceability
• Texas Instruments high temperature products
utilize highly optimized silicon (die) solutions
with design and process enhancements to
maximize performance over extended
temperatures.
(1) Custom temperature ranges available
HKJ PACKAGE
(TOP VIEW)
DNC
1
V
2
IN
TEMP
3
GND
4
8 DNC
7 NC
6V
OUT
5 TRIM/NR
DNC = Do not connect
NC = No internal connection
HKQ PACKAGE
(TOP VIEW)
8
DNC
NC
V_OUT
TRIM/NR
5
1
DNC
V_IN
TEMP
GND
4
HKQ as formed or HKJ mounted dead bug
DESCRIPTION
The REF5025 is a low-noise, low-drift, very high precision voltage reference. This reference is capable of both
sinking and sourcing, and is very robust with regard to line and load changes.
Temperature drift (40 ppm/°C) from –55°C to 210°C is achieved using proprietary design techniques. These
features combined with very low noise make the REF5025 ideal for use in down-hole drilling applications.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2013, Texas Instruments Incorporated