REF3140-DIE Datasheet, PDF (1/4 Pages) Texas Instruments – SERIES VOLTAGE REFERENCE

REF3140-DIE
www.ti.com
FEATURES
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• Low Dropout
• High Output Current
• High Accuracy
• Low I_Q
SERIES VOLTAGE REFERENCE
Check for Samples: REF3140-DIE
SBVS205 – JUNE 2012
APPLICATIONS
• Portable, Battery Powered Equipment
• Data Acquisition Systems
• Medical Equipment
• Hand Held Test Equipment
DESCRIPTION
The REF3140 is a precision, low power, low dropout, series voltage reference.
The REF3140’s small size and low power consumption make it ideal for portable and battery-powered
applications. The REF3140 does not require a load capacitor, but is stable with any capacitive load and can
sink/source up to 10mA of output current.
Unloaded, the REF3140 can be operated on supplies down to 5 mV above the output voltage.
PRODUCT
REF3140
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER
Bare die in waffle pack⁽²⁾
REF3140TDD1
REF3140TDD2
PACKAGE QUANTITY
252
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated