English
Language : 

PGA450-Q1 Datasheet, PDF (1/58 Pages) Texas Instruments – ULTRASONIC-SENSOR SIGNAL CONDITIONER
PGA450-Q1
www.ti.com
SLDS185A – APRIL 2012 – REVISED APRIL 2012
ULTRASONIC-SENSOR SIGNAL CONDITIONER
Check for Samples: PGA450-Q1
FEATURES
1
• Dual NMOS Low-Side Drivers
• Configurable Burst Generator
• Low-Noise Amplifier
• 12-Bit SAR ADC
• Configurable Digital Band-Pass Filter
• Digital Signal Envelope Detect
• On-Chip 8-Bit Microprocessor
• LIN 2.1 Physical Interface and Protocol
• Watchdog Timer
• Four-Wire SPI for Testability / Programming
• 8K Bytes OTP
• 768 Bytes of FIFO RAM
• 256 Bytes Scratchpad RAM
• 8K Bytes of Development RAM
• 32 Bytes of EEPROM for Application
APPLICATIONS
• Automotive Park Distance
• Blind Spot Detection
• Object Detection Applications
DESCRIPTION
The PGA450-Q1 is a fully integrated interface device
for ultrasonic transducers used in automotive park
distance or object detection applications. It
incorporates these system blocks: voltage regulators,
a 12-bit SAR ADC, an 8-bit microcontroller, a digital
band-pass filter, a DAC, dual NMOS low-side drivers,
a low-noise amplifier, an oscillator, and a LIN 2.1
physical interface and protocol for interfacing.
The PGA450-Q1 possesses an 8-bit microcontroller
and OTP memory for program storage for processing
the echo signal and calculating the distance between
the transducer and the object. This data is
transmitted through the LIN 2.1 communication
protocol. The LIN 2.1 physical layer is slave-only and
does not implement the LIN wake-up feature. All
other LIN 2.1 features can be implemented in
software.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated