OPA857-DIE Datasheet, PDF (1/6 Pages) Texas Instruments – Ultralow-Noise, Wideband, Selectable-Feedback Resistance Transimpedance Amplifier

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OPA857-DIE
SBOS813 – AUGUST 2016
OPA857-DIE
Ultralow-Noise, Wideband, Selectable-Feedback Resistance Transimpedance Amplifier
1 Features
•1 Internal Midscale Reference Voltage
• Pseudo-Differential Output Voltage
• Wide Dynamic Range
• Closed-Loop Transimpedance Bandwidth:
– 125 MHz (5-kΩ Transimpedance Gain, 1.5-pF
External Parasitic Capacitance)
– 105 MHz (20-kΩ Transimpedance Gain, 1.5-pF
External Parasitic Capacitance)
• Ultralow Input-Referred Current Noise (Brickwall
Filter BW = 135 MHz):
– 15 nA_RMS (20-kΩ Transimpedance)
• Very Fast Overload Recovery Time: < 25 ns
• Internal Input Protection Diode
• Power Supply:
– Voltage: 2.7 V to 3.6 V
– Current: 23.4 mA
• Extended Temperature Range: –40°C to +85°C
2 Applications
• Photodiode Monitoring
• High-Speed I/V Conversions
• Optical Amplifiers
• CAT-Scanner Front-Ends
3 Description
The OPA857-DIE is a wideband, fast overdrive
recovery, fast-settling, ultralow-noise transimpedance
amplifier targeted at photodiode monitoring
applications. With selectable feedback resistance, the
OPA857-DIE simplifies the design of high-
performance optical systems. Very fast overload
recovery time and internal input protection provide the
best combination to protect the remainder of the
signal chain from overdrive while minimizing recovery
time. The two selectable transimpedance gain
configurations allow high dynamic range and flexibility
required in modern transimpedance amplifier
applications.
The device is characterized for operation over the full
industrial temperature range from –40°C to +85°C.
PRODUCT
OPA857-DIE
PACKAGE
DESIGNATOR
TD
Ordering Information⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
Bare die in gel pak VR⁽²⁾
OPA857TD1
324
OPA857TD2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.