OPA846-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – WIDEBAND, LOW-NOISE, VOLTAGE-FEEDBACK OPERATIONAL AMPLIFIER

OPA846-DIE
www.ti.com
SBOS696 – DECEMBER 2013
WIDEBAND, LOW-NOISE, VOLTAGE-FEEDBACK OPERATIONAL AMPLIFIER
Check for Samples: OPA846-DIE
FEATURES
1
• High Bandwidth
• Low Input Voltage Noise
• Very Low Distortion
• High Slew Rate
• High DC Accuracy
• Low Supply Current
• High Gain Bandwidth Product
APPLICATIONS
• High Dynamic Range ADC Preamps
• Low-Noise, Wideband, Transimpedance
Amplifiers
• Wideband, High Gain Amplifiers
• Low-Noise Differential Receivers
• VDSL Line Receivers
• Ultrasound Channel Amplifiers
• Security Sensor Front Ends
DESCRIPTION
The OPA846-DIE combines very high gain bandwidth and large signal performance with very low input voltage
noise, while dissipating a low supply current. The classical differential input stage, along with two stages of
forward gain and a high power output stage, combine to make the OPA846-DIE an exceptionally low distortion
amplifier with excellent DC accuracy and output drive. The voltage-feedback architecture allows all standard op
amp applications to be implemented with very high performance.
The combination of low input voltage and current noise, along with gain bandwidth, make the OPA846 an ideal
amplifier for wideband transimpedance stages.
A new external compensation technique can be used to give a very flat frequency response below the minimum
stable gain for the OPA846-DIE, further improving its already exceptional distortion performance.
PRODUCT
OPA846
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
Bare die in waffle pack⁽²⁾
OPA846TDB1
300
OPA846TDB2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated