OPA657-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – 1.6-GHz, Low-Noise, FET-Input Operational Amplifier

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OPA657-DIE
SBOS787 – AUGUST 2016
OPA657-DIE 1.6-GHz, Low-Noise, FET-Input Operational Amplifier
1 Features
3 Description
•1 High Gain Bandwidth Product: 1.6 GHz
• High Bandwidth 275 MHz (G = 10)
• Slew Rate 700 V/µs (G = 10, 1-V Step)
• Low-Input Offset Voltage: ±250 µV
• Low-Input Bias Current: 2 pA
• Low-Input Voltage Noise: 4.8 nV/√Hz
• High-Output Current: 70 mA
• Fast Overdrive Recovery
2 Applications
• Wideband Photodiode Amplifiers
• Wafer Scanning Equipment
• ADC Input Amplifiers
• Test and Measurement Front Ends
• High Gain Precision Amplifiers
The OPA657 device combines a high gain-bandwidth,
low-distortion, voltage-feedback operational amplifier
with a low voltage noise JFET-input stage to offer a
very high dynamic range amplifier for high-precision
analog-to-digital converter (ADC) driving or wideband
transimpedance applications. Photodiode applications
achieve improved noise and bandwidth using this
decompensated, high gain-bandwidth amplifier.
Very low level signals can be significantly amplified in
a single OPA657 gain stage with exceptional
bandwidth and accuracy. The very low input bias
current and capacitance supports this performance
even for relatively high source impedance.
Broadband photodetector applications benefit from
the low voltage noise JFET inputs for the OPA657.
The JFET input contributes virtually no current noise,
which makes the device ideal for high-gain
photodiode applications.
• Optical Time Domain Reflectometry (OTDR)
Ordering Information⁽¹⁾
PRODUCT
PACKAGE
DESIGNATOR
PACKAGE
ORDERABLE PART NUMBER PACKAGE QUANTITY
OPA657
TD
Bare Die in Gel Pak VR⁽²⁾
OPA657TD1
324
OPA657TD2
10
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.