OPA2835-DIE Datasheet, PDF (1/5 Pages) Texas Instruments – ULTRA LOW-POWER, RAIL-TO-RAIL OUT, NEGATIVE RAIL IN, VFB OP AMP

OPA2835-DIE
www.ti.com
SLOS826 – JANUARY 2013
ULTRA LOW-POWER, RAIL-TO-RAIL OUT, NEGATIVE RAIL IN, VFB OP AMP
Check for Samples: OPA2835-DIE
FEATURES
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• Ultra Low Power
– Quiescent Current: 250 µA (typ)
– Power Down Mode: 0.5 µA (typ)
• Bandwidth: 56 MHz
• Slew Rate: 160 V/µs
• Rise Time: 10 ns (2 V_STEP)
• Settling Time: 45 ns (2V_STEP)
• Overdrive Recovery Time: 195ns
• CMRR: 113 dB
• Output Current Drive: 40 mA
• RRO – Rail-to-Rail Output
APPLICATIONS
• Low Power Signal Conditioning
• Audio ADC Input Buffer
• Low Power SAR and ΔΣ ADC Driver
• Portable Systems
• Low Power Systems
• High Density Systems
• Ultrasonic Flow Meter
DESCRIPTION
Fabricated using the industry-leading BiCom-3x (SiGe complimentary bipolar) process, the OPA2835 is a single
and dual ultra low-power, rail-to-rail output, negative rail input, voltage-feedback operational amplifier. Consuming
only 250 µA per channel and a unity gain bandwidth of 56MHz, these amplifiers set an industry leading power-to-
performance ratio for rail-to-rail amplifiers.
For battery powered portable applications where power is of key importance, the OPA2835's low power
consumption and high frequency performance offers designers performance versus power not attainable in other
devices. Coupled with a power savings mode to reduce current to <1.5 μA, the device offers an attractive
solution for high frequency amplifiers in battery powered applications.
PRODUCT
OPA2835
PACKAGE
DESIGNATOR
TD
ORDERING INFORMATION⁽¹⁾
PACKAGE
ORDERABLE PART NUMBER
Bare Die In Waffle
Pack ⁽²⁾
OPA2835TDA1
OPA2835TDA2
PACKAGE QUANTITY
400
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(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated