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LP5550 Datasheet, PDF (1/28 Pages) National Semiconductor (TI) – PowerWise Technology Compliant Energy Management Unit
LP5550
www.ti.com
SNVS378G – OCTOBER 2005 – REVISED APRIL 2013
LP5550 PowerWise™ Technology Compliant Energy Management Unit
Check for Samples: LP5550
FEATURES
1
•2 Supports High-Efficiency PowerWise
Technology Adaptive Voltage Scaling
• PWI Open Standard Interface for System
Power Management
• Digitally Controlled Intelligent Voltage Scaling
• 1 MHz PWM Switching Frequency
• Auto or PWI Controlled PFM Mode Transition
• Internal Soft Start/Startup Sequencing
• 3 Programmable LDOs for I/O, PLL, and
Memory Retention Supply Generation
• Power OK Output
APPLICATIONS
• GSM/GPRS/EDGE & UMTS Cellular Handsets
• Hand-Held Radios
• PDAs
• Battery Powered Devices
• Portable Instruments
DESCRIPTION
The LP5550 is a PWI 1.0 compliant Energy
Management System for reducing power
consumption of stand-alone mobile phone processors
such as base-band or applications processors.
The LP5550 contains an advanced, digitally
controlled switching regulator for supplying variable
voltage to processor core and memory. The device
also incorporates 3 programmable LDO-regulators for
powering I/O, PLLs and maintaining memory
retention in shutdown-mode.
The device is controlled via the PWI open-standard
interface. The LP5550 operates cooperatively with
PowerWise technology compatible processors to
optimize supply voltages adaptively over process and
temperature variations or dynamically using
frequency/voltage pre-characterized look-up tables.
System Diagram
VBAT
ENABLE
RESETN
LP5550
LDO3
SW
Slave Power
Controller
(SPC)
LDO1
LDO2
VO3
SW
FB
SCLK
SPWI
PWROK
VO1
VO2
AVS
PWI
SoC
Embedded Memory
Processor Core
AVS/DVS domain
Hardware Performance
Monitor (HPM)
Advanced Power
Controller (APC)
PLL
I/O Bus
Figure 1. System Diagram
1
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2013, Texas Instruments Incorporated