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LP5524 Datasheet, PDF (1/14 Pages) National Semiconductor (TI) – Parallel LED Driver with PWM Brightness Control in Micro SMD Package
LP5524
www.ti.com
SNVS500 – JULY 2007
LP5524 Parallel LED Driver with PWM Brightness Control in Micro SMD Package
Check for Samples: LP5524
FEATURES
1
•2 High side LED driver
• Drives 4 LEDs with Up to 25mA per LED
• Ultra-Small Solution Size:
– No External Components
– Micro SMD-9 Package with 0.4 mm pitch:
– 1.215mm x 1.215mm x 0.6mm (LxWxH)
• 0.4% Typical Current Matching
• PWM Brightness Control
• Over-Current Protection
• Wide Input Voltage Range: 2.7V to 5.5V
APPLICATIONS
• Sub display Backlight
• Keypad LED Backlight
• Indicator LED
DESCRIPTION
The LP5524 is a highly integrated dual-zone LED driver that can drive up to four LEDs in parallel with a total
output current of 100mA. Regulated high side internal current sources deliver excellent current and brightness
matching in all LEDs.
LED driver current sources are split into two independently controlled banks for driving secondary displays,
keypad and indicator LEDs. Brightness control is achieved by applying PWM signals to each enable pin. Default
LED current is factory-programmable and an optional external resistor can be used to set LED current to user
programmable values.
LP5524 is available in National’s tiny 9-bump thin micro SMD package.
Typical Application
VIN
VIN
IDX = 25 mA max
D1A
ENA
D2A
LP5524
ENB
D1B
RISET
(optional)
ISET
D2B
GND
Connection Diagram
Connection Diagrams and Package Mark Information
Micro SMD-9 package, 1.215 x 1.215 x 0.60 mm body size, 0.4 mm pitch
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007, Texas Instruments Incorporated