LMV7291 Datasheet, PDF (1/23 Pages) National Semiconductor (TI) – Single 1.8V Low Power Comparator with Rail-to-Rail Input

LMV7291
www.ti.com
SNOSA86E – FEBRUARY 2004 – REVISED MARCH 2013
LMV7291 Single 1.8V Low Power Comparator with Rail-to-Rail Input
Check for Samples: LMV7291
FEATURES
1
•2 (V_S = 1.8V, T_A = 25°C, Typical
Values unless Specified)
• Single Supply
• Ultra Low Supply Current 9µA per Channel
• Low Input Bias Current 10nA
• Low Input Offset Current 200pA
• Low ensured V_OS 4mV
• Propagation Delay 880ns (20mV Overdrive)
• Input Common Mode Voltage Range 0.1V
beyond Rails
APPLICATIONS
• Mobile Communications
• Laptops and PDA's
• Battery Powered Electronics
• General Purpose Low Voltage Applications
DESCRIPTION
The LMV7291 is a rail-to-rail input low power
comparator, characterized at supply voltage 1.8V,
2.7V and 5.0V. It consumes only 9uA supply current
per channel while achieving a 800ns propagation
delay.
The LMV7291 is available in SC70 package. With this
tiny package, the PC board area can be significantly
reduced. It is ideal for low voltage, low power and
space critical designs.
The LMV7291 features a push-pull output stage
which allows operation with minimum power
consumption when driving a load.
The LMV7291 is built with Texas Instruments'
advance submicron silicon-gate BiCMOS process. It
has bipolar inputs for improved noise performance
and CMOS outputs for rail-to-rail output swing.
Typical Circuit
V_IN
V_CC
R₁
C1 =
C2 =
0.1µF
10µF
+
V_OUT
R₂
-
V_REF
Figure 1. Threshold Detector
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2013, Texas Instruments Incorporated