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LMK03000 Datasheet, PDF (1/45 Pages) Texas Instruments – Precision Clock Conditioner
LMK03000, LMK03000C, LMK03000D, LMK03001
LMK03001C, LMK03001D, LMK03033, LMK03033C
www.ti.com
SNAS381O – NOVEMBER 2006 – REVISED MARCH 2013
LMK03000 Family Precision Clock Conditioner with Integrated VCO
Check for Samples: LMK03000, LMK03000C, LMK03000D, LMK03001, LMK03001C, LMK03001D, LMK03033, LMK03033C
1 FEATURES
12
• Integrated VCO with Very Low Phase Noise
Floor
• Integrated Integer-N PLL with Outstanding
Normalized Phase Noise Contribution of -224
dBc/Hz
• VCO Divider Values of 2 to 8 (All Divides)
• Channel Divider Values of 1, 2 to 510 (even
divides)
• LVDS and LVPECL Clock Outputs
• Partially Integrated Loop Filter
• Dedicated Divider and Delay Blocks on Each
Clock Output
• Pin Compatible Family of Clocking Devices
• 3.15 to 3.45 V Operation
• Package: 48 Pin WQFN (7.0 x 7.0 x 0.8 mm)
• 200 fs RMS Clock Generator Performance (10
Hz to 20 MHz) with a Clean Input Clock
1.1 TARGET APPLICATIONS
• Data Converter Clocking
• Networking, SONET/SDH, DSLAM
• Wireless Infrastructure
• Medical
• Test and Measurement
• Military / Aerospace
Device
LMK03000C
LMK03000
LMK03000D
LMK03001C
LMK03001
LMK03001D
LMK03033C
LMK03033
Outputs
3 LVDS
5 LVPECL
4 LVDS
4 LVPECL
VCO
Tuning Range RMS Jitter
(MHz)
(fs)
400
1185 - 1296
800
1200
400
1470 - 1570
800
1200
500
1843 - 2160
800
Recovered
³GLUW\´ FORFN RU
clean clock
OSCin
CLKout0
LMK0300xx CLKout1
Precision Clock
Conditioner
CLKout4
CLKout7
Fout
LMX2531
PLL+VCO
Serializer/
Deserializer
FPGA
> 1 Gsps
ADC
DAC
0XOWLSOH ³FOHDQ´ FORFNV DW
different frequencies
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date. Products conform to
specifications per the terms of the Texas Instruments standard warranty. Production
processing does not necessarily include testing of all parameters.
Copyright © 2006–2013, Texas Instruments Incorporated