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LM5005_14 Datasheet, PDF (1/28 Pages) Texas Instruments – High Voltage 2.5 Amp Buck Regulator
LM5005
www.ti.com
SNVS397C – SEPTEMBER 2005 – REVISED MARCH 2007
LM5005 High Voltage 2.5 Amp Buck Regulator
Check for Samples: LM5005
FEATURES
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•2 Integrated 75V, 2.5A N-Channel Buck Switch
• Ultra-wide input voltage range from 7V to 75V
• Internal high voltage bias regulator
• Adjustable output voltage from 1.225V
• 1.5% feedback reference accuracy
• Current mode control with emulated inductor
current ramp
• Single resistor oscillator frequency setting
• Oscillator synchronization input
• Programmable soft-start
• Shutdown / Standby input
• Wide bandwidth error amplifier
• Thermal Shutdown
DESCRIPTION
The LM5005 high voltage switching regulator features
all of the functions necessary to implement an
efficient high voltage buck regulator using a minimum
of external components. This easy to use regulator
includes a 75V N-Channel buck switch with an output
current capability of 2.5 Amps. The regulator control
method is based upon current mode control utilizing
an emulated current ramp. Current mode control
provides inherent line feed-forward, cycle-by-cycle
current limiting and ease of loop compensation. The
use of an emulated control ramp reduces noise
sensitivity of the pulse-width modulation circuit,
allowing reliable control of very small duty cycles
necessary in high input voltage applications. The
operating frequency is programmable from 50kHz to
500kHz. An oscillator synchronization pin allows
multiple LM5005 regulators to self-synchronize or to
be synchronized to an external clock. Additional
protection features include: current limit, thermal
shutdown and remote shutdown capability. The
device is available in a power enhanced HTSSOP
package featuring an exposed die attach pad to aid
thermal dissipation.
Package
• HTSSOP (Exposed Pad)
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2007, Texas Instruments Incorporated