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LM5000_14 Datasheet, PDF (1/23 Pages) Texas Instruments – High Voltage Switch Mode Regulator
LM5000
www.ti.com
SNVS176D – MAY 2004 – REVISED MARCH 2007
LM5000 High Voltage Switch Mode Regulator
Check for Samples: LM5000
FEATURES
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•2 80V internal switch
• Operating input voltage range of 3.1V to 40V
• Pin selectable operating frequency
–
300kHz/700kHz (-3)
–
600kHz/1.3MHz (-6)
• Adjustable output voltage
• External compensation
• Input undervoltage lockout
• Softstart
• Current limit
• Over temperature protection
• External shutdown
• Small 16-Lead TSSOP or 16-Lead LLP package
APPLICATIONS
• Flyback Regulator
• Forward Regulator
• Boost Regulator
• DSL Modems
• Distributed Power Converters
DESCRIPTION
The LM5000 is a monolithic integrated circuit specifically designed and optimized for flyback, boost or forward
power converter applications. The internal power switch is rated for a maximum of 80V, with a current limit set to
2A. Protecting the power switch are current limit and thermal shutdown circuits. The current mode control
scheme provides excellent rejection of line transients and cycle-by-cycle current limiting. An external
compensation pin and the built-in slope compensation allow the user to optimize the frequency compensation.
Other distinctive features include softstart to reduce stresses during start-up and an external shutdown pin for
remote ON/OFF control. There are two operating frequency ranges available. The LM5000-3 is pin selectable for
either 300kHz (FS Grounded) or 700kHz (FS Open). The LM5000-6 is pin selectable for either 600kHz (FS
Grounded) or 1.3MHz (FS Open). The device is available in a low profile 16-lead TSSOP package or a thermally
enhanced 16-lead LLP package.
Typical Application Circuit
Figure 1. LM5000 Flyback Converter
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2007, Texas Instruments Incorporated