LM4818 Datasheet, PDF (1/22 Pages) National Semiconductor (TI) – 350mW Audio Power Amplifier with Shutdown Mode

LM4818
www.ti.com
SNAS163B – APRIL 2002 – REVISED MAY 2013
LM4818
350mW Audio Power Amplifier with Shutdown
Mode
Check for Samples: LM4818
FEATURES
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•23 SOIC Surface Mount Packaging.
• Switch On/Off Click Suppression.
• Unity-Gain Stable.
• Minimum External Components.
APPLICATIONS
• General Purpose Audio
• Portable Electronic Devices
• Information Appliances (IA)
KEY SPECIFICATIONS
• THD+N at 1kHz, 350mW Continuous Average
Output Power into 16Ω 10% (max)
• THD+N at 1kHz, 300mW Continuous Average
Output Power into 8Ω 10% (max)
• Shutdown Current 0.7µA (typ)
DESCRIPTION
The LM4818 is a mono bridged power amplifier that
is capable of delivering 350mW_RMS output power into
a 16Ω load or 300mW_RMS output power into an 8Ω
load with 10% THD+N from a 5V power supply.
The LM4818 Boomer™ audio power amplifier is
designed specifically to provide high quality output
power and minimize PCB area with surface mount
packaging and a minimal amount of external
components. Since the LM4818 does not require
output coupling capacitors, bootstrap capacitors or
snubber networks, it is optimally suited for low-power
portable applications.
The closed loop response of the unity-gain stable
LM4818 can be configured using external gain-setting
resistors. The device is available in SOIC package
type to suit various applications.
Typical Application
Figure 1. Typical Audio Amplifier Application Circuit
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Boomer is a trademark of Texas Instruments.
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All other trademarks are the property of their respective owners.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2013, Texas Instruments Incorporated