LF411JAN_16 Datasheet, PDF (1/18 Pages) Texas Instruments – Low Offset, Low Drift JFET Input Operational Amplifier

Not Recommended For New Designs
LF411JAN
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SNOSAQ4A – OCTOBER 2005 – REVISED MARCH 2013
LF411JAN Low Offset, Low Drift JFET Input Operational Amplifier
Check for Samples: LF411JAN
FEATURES
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•23 Internally Trimmed Offset Voltage: 0.5 mV(Typ)
• Input Offset Voltage Drift: 30 μV/°C
• Low Input Bias Current: 50 pA
• Low Input Noise Current: 0.01 pA/√Hz
• Wide Gain Bandwidth: 3 MHz Typ.
• High Slew Rate: 7V/μs (Min.)
• Low Supply Current: 1.8 mA
• High Input Impedance: 10¹²Î©
• Low Total Harmonic Distortion: A_V = 10,
R_L = 10KΩ, V_O = 20V_P-P, BW = 20Hz - 20kHz
<0.02%
• Low 1/f Noise Corner: 50 Hz
• Fast Settling Time to 0.01%: 1.5 μs
DESCRIPTION
This device is a low cost, high speed, JFET input
operational amplifier with very low input offset voltage
and ensured input offset voltage drift. It requires low
supply current yet maintains a large gain bandwidth
product and fast slew rate. In addition, well matched
high voltage JFET input devices provide very low
input bias and offset currents. The LF411 is pin
compatible with the standard LM741 allowing
designers to immediately upgrade the overall
performance of existing designs.
This amplifier may be used in applications such as
high speed integrators, fast D/A converters, sample
and hold circuits and many other circuits requiring low
input offset voltage and drift, low input bias current,
high input impedance, high slew rate and wide
bandwidth.
Connection Diagram
Typical Connection
Figure 1. 8LD Ceramic Dual-in Line Package
See Package Number NAB0008A (Top View)
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
BI-FET II is a trademark of dcl_owner.
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All other trademarks are the property of their respective owners.
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2013, Texas Instruments Incorporated