LF156JAN_13 Datasheet, PDF (1/23 Pages) Texas Instruments – JFET Input Operational Amplifiers

LF156JAN
www.ti.com
SNOSAQ0A – MARCH 2006 – REVISED MARCH 2013
LF156JAN JFET Input Operational Amplifiers
Check for Samples: LF156JAN
FEATURES
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•2 Advantages
– Replace Expensive Hybrid and Module FET
Op Amps
– Rugged JFETs Allow Blow-Out Free
Handling Compared with MOSFET Input
Devices
– Excellent for Low Noise Applications using
either High or Low Source
Impedance—Very Low 1/f Corner
– Offset Adjust does not Degrade Drift or
Common-Mode Rejection as in Most
Monolithic Amplifiers
– New Output Stage Allows use of Large
Capacitive Loads (5,000 pF) without
Stability Problems
– Internal Compensation and Large
Differential Input Voltage Capability
APPLICATIONS
• Precision High Speed Integrators
• Fast D/A and A/D Converters
• High Impedance Buffers
• Wideband, Low Noise, Low Drift Amplifiers
• Logarithmic Amplifiers
• Photocell Amplifiers
• Sample and Hold Circuits
COMMON FEATURES
• Low Input Bias Current: 30pA
• Low Input Offset Current: 3pA
• High Input Impedance: 10¹²Î©
• Low Input Noise Current: 0.01 pA / √Hz
• High Common-Mode Rejection Ratio: 100 dB
• Large DC Voltage Gain: 106 dB
UNCOMMON FEATURES
• Extremely Fast Settling Time to 0.01% 1.5μs
• Fast Slew Rate 12V/µs
• Wide Gain Bandwidth 5MHz
• Low Input Noise Voltage 12 nV / √Hz
DESCRIPTION
This is the first monolithic JFET input operational
amplifier to incorporate well matched, high voltage
JFETs on the same chip with standard bipolar
transistors (BI-FET™ Technology). This amplifier
features low input bias and offset currents/low offset
voltage and offset voltage drift, coupled with offset
adjust which does not degrade drift or common-mode
rejection. The device is also designed for high slew
rate, wide bandwidth, extremely fast settling time, low
voltage and current noise and a low 1/ƒ noise corner.
Connection Diagrams
Figure 1. Top View
Metal Can Package (LMC)
See Package LMC0008C
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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