INA193A-Q1 Datasheet, PDF (1/22 Pages) Texas Instruments – CURRENT SHUNT MONITORS –16-V to +80-V Common-Mode Range

INA193A-Q1, INA194A-Q1, INA195A-Q1
INA196A-Q1, INA197A-Q1, INA198A-Q1
www.ti.com............................................................................................................................................... SBOS366C – AUGUST 2006 – REVISED OCTOBER 2008
CURRENT SHUNT MONITORS
–16-V to +80-V Common-Mode Range
FEATURES
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• Qualified for Automotive Applications
• Wide Common-Mode Voltage:
–16 V to +80 V
• Low Error: 3.0% Over Temperature (Max)
• Bandwidth: Up to 500 kHz
• Three Transfer Functions Available:
20 V/V, 50 V/V, and 100 V/V
• Complete Current-Sense Solution
APPLICATIONS
• Welding Equipment
• Notebook Computers
• Cell Phones
• Telecom Equipment
• Automotive
• Power Management
• Battery Chargers
DESCRIPTION
The INA193A–INA198A family of current shunt monitors with voltage output can sense drops across shunts at
common-mode voltages from –16 V to +80 V, independent of the INA19xA supply voltage. They are available
with three output voltage scales: 20 V/V, 50 V/V, and 100 V/V. The 500-kHz bandwidth simplifies use in current
control loops. The INA193A–INA195A provide identical functions but alternative pin configurations to the
INA196A–INA198A, respectively.
The INA193A–INA198A operate from a single 2.7-V to 18-V supply. They are specified over the extended
operating temperature range (–40°C to 125°C), and are offered in a space-saving SOT-23 package.
V_IN+
–16 V to +80 V
Negative
and
Positive
Common-Mode
Voltage
R_S
V_IN+
5 kΩ
I_S
V+
2.7 V to 18 V
V_IN–
Load
5 kΩ
A1
A2
R_L
INA193A–INA198A
OUT =
I_SR_SR_L
5 kΩ
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2008, Texas Instruments Incorporated