DS96172_15 Datasheet, PDF (1/13 Pages) Texas Instruments – RS-485/RS-422 Quad Differential Line Drivers

DS96172 - Obsolete
DS96174 - Not Recommended For New Designs
DS96172, DS96174
www.ti.com
SNLS390D – JUNE 1998 – REVISED APRIL 2013
DS96172/DS96174 RS-485/RS-422 Quad Differential Line Drivers
Check for Samples: DS96172, DS96174
FEATURES
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•2 Meets EIA Standard RS-485 and RS-422A
• Monotonic Differential Output Switching
• Transmission Rate to 10 Mbs
• Tri-state Outputs
• Designed for Multipoint Bus Transmission
• Common Mode Output Voltage Range: −7V to
+12V
• Operates from Single +5V Supply
• Thermal Shutdown Protection
• DS96172/DS96174 are Lead and Function
Compatible with the SN75172/75174 or the
AM26LS31/MC3487, Respectively
DESCRIPTION
The DS96172 and DS96174 are high speed quad
differential line drivers designed to meet EIA
Standard RS-485. The devices have tri-state outputs
and are optimized for balanced multipoint data bus
transmission at rates up to 10 Mbps. The drivers
have wide positive and negative common mode
range for multipoint applications in noisy
environments. Positive and negative current-limiting
is provided which protects the drivers from line fault
conditions over a +12V to −7.0V common mode
range. A thermal shutdown feature is also provided
and occurs at junction temperature of approximately
160°C. The DS96172 features an active high and
active low Enable, common to all four drivers. The
DS96174 features separate active high Enables for
each driver pair. Compatible RS-485 receivers,
transceivers, and repeaters are also offered to
provide optimum bus performance. The respective
device types are DS96173, DS96175, DS96176, AND
DS96177.
Connection Diagrams
Figure 1. 16-Lead PDIP DS96172
Top View
See Package Number NFG0016E
Figure 2. 16-Lead PDIP DS96174
Top View
See Package Number NFG0016E
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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