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DS90LV017ATMX Datasheet, PDF (1/14 Pages) Texas Instruments – DS90LV017A LVDS Single High Speed Differential Driver
DS90LV017A
www.ti.com
SNLS022C – MARCH 2000 – REVISED APRIL 2013
DS90LV017A LVDS Single High Speed Differential Driver
Check for Samples: DS90LV017A
FEATURES
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•2 >600 Mbps (300 MHz) Switching Rates
• 0.3 ns Typical Differential Skew
• 0.7 ns Maximum Differential Skew
• 1.5 ns Maximum Propagation Delay
• 3.3V Power Supply Design
• ±355 mV Differential Signaling
• Low Power Dissipation (23 mW @ 3.3V Static)
• Flow-Through Design Simplifies PCB Layout
• Interoperable with Existing 5V LVDS Devices
• Power Off Protection (Outputs in High
Impedance)
• Conforms to TIA/EIA-644 Standard
• 8-Lead SOIC Package Saves Space
• Industrial Temperature Operating Range
– (−40°C to +85°C)
DESCRIPTION
The DS90LV017A is a single LVDS driver device
optimized for high data rate and low power
applications. The DS90LV017A is a current mode
driver allowing power dissipation to remain low even
at high frequency. In addition, the short circuit fault
current is also minimized. The device is designed to
support data rates in excess of 600Mbps (300MHz)
utilizing Low Voltage Differential Signaling (LVDS)
technology.
The device is in a 8-lead SOIC package. The
DS90LV017A has a flow-through design for easy
PCB layout. The differential driver outputs provides
low EMI with its typical low output swing of 355 mV.
The DS90LV017A can be paired with its companion
single line receiver, the DS90LV018A, or with any of
TI's LVDS receivers, to provide a high-speed point-to-
point LVDS interface.
Connection Diagram
Functional Diagram
Figure 1. Dual-In-Line
See Package Number D (R-PDSO-G8)
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2013, Texas Instruments Incorporated