DS90LV011A_16 Datasheet, PDF (1/13 Pages) Texas Instruments – 3V LVDS Single High Speed Differential Driver

DS90LV011A
www.ti.com
SNLS140C – MAY 2002 – REVISED APRIL 2013
DS90LV011A 3V LVDS Single High Speed Differential Driver
Check for Samples: DS90LV011A
FEATURES
1
•2 Conforms to TIA/EIA-644-A Standard
• >400Mbps (200MHz) Switching Rates
• 700 ps (100 ps Typical) Maximum Differential
Skew
• 1.5 ns Maximum Propagation Delay
• Single 3.3V Power Supply
• ±350 mV Differential Signaling
• Power Off Protection (Outputs in TRI-STATE)
• Pinout Simplifies PCB Layout
• Low Power Dissipation (23 mW @ 3.3V
Typical)
• SOT-23 5-Lead Package
• SOT-23 Version Pin Compatible with
SN65LVDS1
• Fabricated with Advanced CMOS Process
Technology
• Industrial Temperature Operating Range
– (−40°C to +85°C)
DESCRIPTION
The DS90LV011A is a single LVDS driver device
optimized for high data rate and low power
applications. The DS90LV011A is a current mode
driver allowing power dissipation to remain low even
at high frequency. In addition, the short circuit fault
current is also minimized. The device is designed to
support data rates in excess of 400Mbps (200MHz)
utilizing Low Voltage Differential Signaling (LVDS)
technology.
The device is in a 5-lead SOT-23 package. The
LVDS outputs have been arranged for easy PCB
layout. The differential driver outputs provide low EMI
with its typical low output swing of 350 mV. The
DS90LV011A can be paired with its companion single
line receiver, the DS90LV012A, or with any of TI's
LVDS receivers, to provide a high-speed LVDS
interface.
Connection Diagram
Figure 1. Top View
See Package Number DBV (R-PDSO-G5)
Functional Diagram
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
1
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2013, Texas Instruments Incorporated