DS34LV87T_14 Datasheet, PDF (1/14 Pages) Texas Instruments – DS34LV87T Enhanced CMOS Quad Differential Line Driver

DS34LV87T
www.ti.com
SNLS116D – JULY 2006 – REVISED APRIL 2013
DS34LV87T Enhanced CMOS Quad Differential Line Driver
Check for Samples: DS34LV87T
FEATURES
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• Meets TIA/EIA-422-B (RS-422) and ITU-T V.11
Recommendation
• Interoperable With Existing 5V RS-422
Networks
• Ensured V_OD of 2V Min Over Operating
Conditions
• Balanced Output Crossover for Low EMI
(Typical Within 40 mV of 50% Voltage Level)
• Low Power Design (330 μW @ 3.3V Static)
• ESD ≥ 7 kV on Cable I/O Pins (HBM)
• Industrial Temperature Range
• Ensured AC Parameter:
– Maximum Driver Skew: 2 ns
– Maximum Transition Time: 10 ns
• Pin Compatible With DS26C31
• Available in SOIC Packaging
Connection Diagram
DESCRIPTION
The DS34LV87T is a high speed quad differential
CMOS driver that meets the requirements of both
TIA/EIA-422-B and ITU-T V.11. The CMOS
DS34LV87T features low static I_CC of 100 μA max
which makes it ideal for battery powered and power
conscious applications. The TRI-STATE enable, EN,
allows the device to be disabled when the device is
not in use to minimize power. The dual enable
scheme allows for flexibility in turning devices on or
off.
Protection diodes protect all the driver inputs against
electrostatic discharge. The driver and enable inputs
(DI and EN) are compatible with LVTTL and
LVCMOS devices. Differential outputs have the same
V_OD (≥2V) ensure as the 5V version. The outputs
have enhanced ESD Protection providing greater
than 7 kV tolerance.
Enables
EN
L
H
H
TRUTH TABLE⁽¹⁾
Input
Outputs
DI
DO+
DO−
X
Z
Z
H
H
L
L
L
H
Figure 1. Dual-In-Line Package (Top View)
See Package Number D0016A
(1) L = Low logic state
X = Irrelevant
H = High logic state
Z = TRI-STATE
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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