DS110DF1610 Datasheet, PDF (1/6 Pages) Texas Instruments – 8.5 to 11.3 Gbps 16 Channel Retimer

DS110DF1610
www.ti.com
SNLS472 – OCTOBER 2013
DS110DF1610 8.5 to 11.3 Gbps 16 Channel Retimer
Check for Samples: DS110DF1610
FEATURES
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• Pin Compatible Family
– DS150DF1610: 12.5 - 15G
– DS125DF1610: 9.8 to 12.5G
– DS110DF1610: 8.5 – 11.3G
• 4x4 analog cross point switch for each quad
• Fully Adaptive CTLE
• Self tuning DFE, with optional continuous
adaption
• On-chip AC coupling on receive inputs
• Adjustable Transmit V_OD
• Adjustable 3-tap transmit FIR Filter
• Locks to half/quarter/eighth data rates for
legacy support
• On-chip Eye Monitor(EOM), PRBS Checker,
PRBS Pattern Generator
• Supports IEEE 1149.1 and 1149.6
• Programmable output polarity inversion
• Input signal detection, CDR lock detection
• Single 2.5 V ±5% power supply
• SMBus based register configuration
• Optional EEPROM configuration
• 15 mm x 15 mm, 196-pin FCBGA package
• Operating temp range : -10°C to +85°C
DESCRIPTION
The DS110DF1610 is a sixteen-channel multi-rate
retimer with integrated signal conditioning. The device
includes a full adaptive Continuous Time Linear
Equalizer (CTLE), Decision Feedback Equalizer
(DFE), clock and data recovery (CDR), and a transmit
FIR filter to enhance the reach and robustness over
long, lossy, crosstalk impaired high speed serial links
to achieve BER < 1×10^-15.
Each channel of the DS110DF1610 independently
locks to serial data at 8.5 to 11.3 Gbps and any
supported sub-multiple. A simple external oscillator
(±100ppm) that is synchronous or asynchronous with
the incoming data stream can be used as a reference
clock to speed up the lock process. Integrated 4x4
cross point switches allow for full non-blocking routing
or broadcasting within each quad of the
DS110DF1610.
Programmable transmit FIR filter offers control of the
pre-cursor, main tap and post-cursor for transmit
equalization. The fully adaptive receive equalization
(CTLE and DFE) enables longer distance
transmission in lossy copper interconnects and
backplanes with multiple connectors.
A non-disruptive mission mode eye-monitor feature
allows link monitoring internal to the receiver. The
built-in PRBS generator and checker compliment the
internal diagnostic features to complete standalone
BERT measurements. Built-in JTAG enables
manufacturing tests.
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated