CY54FCT273T_14 Datasheet, PDF (1/12 Pages) Texas Instruments – 8-BIT REGISTERS

D Function, Pinout, and Drive Compatible
With FCT and F Logic
D Reduced V_OH (Typically = 3.3 V) Versions
of Equivalent FCT Functions
D Edge-Rate Control Circuitry for
Significantly Improved Noise
Characteristics
D I_off Supports Partial-Power-Down Mode
Operation
D Matched Rise and Fall Times
D ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
D Fully Compatible With TTL Input and
Output Logic Levels
D CY54FCT273T
– 32-mA Output Sink Current
– 12-mA Output Source Current
D CY74FCT273T
– 64-mA Output Sink Current
– 32-mA Output Source Current
description
The ’FCT273T devices consist of eight
edge-triggered D-type flip-flops with individual
D inputs and Q outputs. The common
buffered-clock (CP) and master-reset (MR) inputs
load and reset all flip-flops simultaneously. These
devices are edge-triggered registers. The state of
each D input (one setup time before the
low-to-high clock transition) is transferred to the
corresponding flip-flop’s Q output. All outputs are
forced low by a low logic level on the MR input.
This device is fully specified for
partial-power-down applications using I_off. The I_off
circuitry disables the outputs, preventing
damaging current backflow through the device
when it is powered down.
CY54FCT273T, CY74FCT273T
8-BIT REGISTERS
SCCS020A – MARCH 1995 – REVISED OCTOBER 2001
CY54FCT273T . . . D PACKAGE
CY74FCT273T . . . Q OR SO PACKAGE
(TOP VIEW)
MR 1
Q₀ 2
D₀ 3
D₁ 4
Q₁ 5
Q₂ 6
D₂ 7
D₃ 8
Q₃ 9
GND 10
20 V_CC
19 Q₇
18 D₇
17 D₆
16 Q₆
15 Q₅
14 D₅
13 D₄
12 Q₄
11 CP
CY54FCT273T . . . L PACKAGE
(TOP VIEW)
3 2 1 20 19
D_{1 4}
18 ^D₇
Q_{1 5}
17 D₆
Q₂ 6
16 Q₆
D₂ 7
15 Q₅
D₃ 8
14 D₅
9 10 11 12 13
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2001, Texas Instruments Incorporated
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