CD74AC151_14 Datasheet, PDF (1/14 Pages) Texas Instruments – 8-LINE TO 1-LINE DATA SELECTOR/MULTIPLEXER

CD74AC151
8-LINE TO 1-LINE DATA SELECTOR/MULTIPLEXER
D AC Types Feature 1.5-V to 5.5-V Operation
and Balanced Noise Immunity at 30% of the
Supply Voltage
D 8-Line to 1-Line Multiplexers Can Perform
as:
– Boolean Function Generators
– Parallel-to-Serial Converters
– Data Source Selectors
D Speed of Bipolar F, AS, and S, With
Significantly Reduced Power Consumption
D Balanced Propagation Delays
D ±24-mA Output Drive Current
– Fanout to 15 F Devices
D SCR-Latchup-Resistant CMOS Process and
Circuit Design
D Exceeds 2-kV ESD Protection Per
MIL-STD-883, Method 3015
SCHS333 – MARCH 2003
E OR M PACKAGE
(TOP VIEW)
D3 1
D2 2
D1 3
D0 4
Y5
W6
G7
GND 8
16 V_CC
15 D4
14 D5
13 D6
12 D7
11 A
10 B
9C
description/ordering information
This data selector/multiplexer provides full binary decoding to select one of eight data sources. The strobe (G)
input must be at a low logic level to enable the inputs. A high level at the strobe terminal forces the W output
high and the Y output low.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – E
–55°C to 125°C
SOIC – M
Tube
CD74AC151E
Tape and reel CD74AC151M96
CD74AC151E
AC151M
† _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines}
are available at www.ti.com/sc/package.
FUNCTION TABLE
INPUTS
OUTPUTS
SELECT
C
B
A
STROBE
G
Y
W
X
X
X
H
L
H
L
L
L
L
D0 D0
L
L
H
L
D1 D1
L
H
L
L
D2 D2
L
H
H
L
D3 D3
H
L
L
L
D4 D4
H
L
H
L
D5 D5
H
H
L
L
D6 D6
H
H
H
L
D7 D7
D0, D1 . . . D7 = the level of the respective D input
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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Copyright  2003, Texas Instruments Incorporated
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