CD54ACT20 Datasheet, PDF (1/13 Pages) Texas Instruments – DUAL 4-INPUT POSITIVE-NAND GATES

CD54ACT20, CD74ACT20
DUAL 4-INPUT POSITIVE-NAND GATES
D Inputs Are TTL-Voltage Compatible
D Speed of Bipolar F, AS, and S, With
Significantly Reduced Power Consumption
D Balanced Propagation Delays
D ±24-mA Output Drive Current
– Fanout to 15 F Devices
D SCR-Latchup-Resistant CMOS Process and
Circuit Design
D Exceeds 2-kV ESD Protection Per
MIL-STD-883, Method 3015
SCHS320 – NOVEMBER 2002
CD54ACT20 . . . F PACKAGE
CD74ACT20 . . . E OR M PACKAGE
(TOP VIEW)
1A ₁
1B 2
NC 3
1C 4
1D 5
1Y 6
GND 7
14 ^V_CC
13 2D
12 2C
11 NC
10 2B
9 2A
8 2Y
description/ordering information
The ’ACT20 devices contain two independent 4-input NAND gates. They perform the Boolean function
Y = A • B • C • D or Y = A + B + C + D in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – E
Tube
CD74ACT20E
CD74ACT20E
–55°C to 125°C SOIC – M
Tube
CD74ACT20M
Tape and reel CD74ACT20M96
ACT20M
CDIP – F
Tube
CD54ACT20F3A
CD54ACT20F3A
† _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines}
are available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
A
B
C
D
Y
H
H
H
H
L
L
X
X
X
H
X
L
X
X
H
X
X
L
X
H
X
X
X
L
H
logic diagram (positive logic)
1A
1B
1C
1D
1
2
4
5
6 _1Y
2A
2B
2C
2D
9
10
12
13
8 _2Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright  2002, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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