CD54AC00 Datasheet, PDF (1/14 Pages) Texas Instruments – QUADRUPLE 2-INPUT POSITIVE-NAND GATES

CD54AC00, CD74AC00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
D AC Types Feature 1.5-V to 5.5-V Operation
and Balanced Noise Immunity at 30% of the
Supply Voltage
D Speed of Bipolar F, AS, and S, With
Significantly Reduced Power Consumption
D Balanced Propagation Delays
D ±24-mA Output Drive Current
– Fanout to 15 F Devices
D SCR-Latchup-Resistant CMOS Process and
Circuit Design
D Exceeds 2-kV ESD Protection Per
MIL-STD-883, Method 3015
SCHS303C – JANUARY 2001 – REVISED JUNE 2002
CD54AC00 . . . F PACKAGE
CD74AC00 . . . E OR M PACKAGE
(TOP VIEW)
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
14 V_CC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
description
The ‘AC00 devices contain four independent 2-input NAND gates. Each gate performs the Boolean function
of Y = A S B or Y = A + B in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
PDIP – E Tube
CD74AC00E
CD74AC00E
Tube
–55°C to 125°C SOIC – M
Tape and reel
CD74AC00M
CD74AC00M96
AC00M
CDIP – F Tube
CD54AC00F3A CD54AC00F3A
† _{Package drawings, standard packing quantities, thermal data, symbolization, and PCB}
design guidelines are available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
A
B
OUTPUT
Y
H
H
L
L
X
H
X
L
H
logic diagram, each gate (positive logic)
A
Y
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright  2002, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
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