ADS7842 Datasheet, PDF (1/20 Pages) Burr-Brown (TI) – 12-Bit, 4-Channel Parallel Output Sampling ANALOG-TO-DIGITAL CONVERTER

ADS7842
ADS7842
SBAS103C – SEPTEMBER 2000 – REVISED OCTOBER 2006
12-Bit, 4-Channel Parallel Output Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
q SINGLE SUPPLY: 2.7V to 5V
q 4-CHANNEL INPUT MULTIPLEXER
q UP TO 200kHz SAMPLING RATE
q FULL 12-BIT PARALLEL INTERFACE
q ±1LSB INL AND DNL
q NO MISSING CODES
q 72dB SINAD
q LOW POWER: 2mW
q SSOP-28 PACKAGE
APPLICATIONS
q DATA ACQUISITION
q TEST AND MEASUREMENT
q INDUSTRIAL PROCESS CONTROL
q MEDICAL INSTRUMENTS
q LABORATORY EQUIPMENT
DESCRIPTION
The ADS7842 is a complete, 4-channel, 12-bit Analog-to-
Digital Converter (ADC). It contains a 12-bit, capacitor-
based, Successive Approximation Register (SAR) ADC with
a sample-and-hold amplifier, interface for microprocessor
use, and parallel, 3-state output drivers. The ADS7842 is
specified at a 200kHz sampling rate while dissipating only
2mW of power. The reference voltage can be varied from
100mV to V_CC with a corresponding LSB resolution from
24µV to 1.22mV. The ADS7842 is tested down to 2.7V
operation.
Low power, high speed, and an onboard multiplexer make
the ADS7842 ideal for battery-operated systems such as
portable, multi-channel dataloggers and measurement equip-
ment. The ADS7842 is available in an SSOP-28 package
and is tested over the –40°C to +85°C temperature range.
AIN0
AIN1
AIN2
AIN3
V_REF
A0 A1
4-Channel
MUX
SAR
ADS7842
CDAC
Comparator
Output
Latches
and
3-State
Drivers
3-State
Parallel
Data Bus
CLK
BUSY
WR
CS
RD
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
www.ti.com
Copyright © 2000-2006, Texas Instruments Incorporated