ADS5422_14 Datasheet, PDF (1/25 Pages) Texas Instruments – 14-Bit, 62MSPS Sampling ANALOG-TO-DIGITAL CONVERTER

ADS5422
ADS5422
SBAS250D – MARCH 2002 – REVISED JUNE 2005
14-Bit, 62MSPS Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
q HIGH DYNAMIC RANGE:
High SFDR: 85dB at 10MHz f_IN
High SNR: 72dB at 10MHz f_IN
q ON-BOARD TRACK-AND-HOLD:
Differential Inputs
Selectable Full-Scale Input Range
q FLEXIBLE CLOCKING:
Differential or Single-Ended
Accepts Sine or Square Wave Clocking Down to
0.5V_PP
Variable Threshold Level
APPLICATIONS
q COMMUNICATIONS RECEIVERS
q TEST INSTRUMENTATION
q CCD IMAGING
DESCRIPTION
The ADS5422 is a high-dynamic range, 14-bit, 62MSPS,
pipelined Analog-to-Digital Converter (ADC). It includes a
high-bandwidth linear track-and-hold amplifier that gives good
spurious performance up to the Nyquist rate. The clock input
can accept a low-level differential sine wave or square wave
signal down to 0.5V_PP, further improving the Signal-to-Noise
Ratio (SNR) performance.
The ADS5422 has a 4V_PP differential input range
(2V_PP • 2 inputs) for optimum Spurious-Free Dynamic
Range (SFDR). The differential operation gives the lowest
even-order harmonic components. A lower input voltage can
also be selected using the internal references, further optimizing
SFDR.
The ADS5422 is available in an LQFP-64 package.
2V_PP
2V_PP
ADS5422
IN
IN
CM
(+2.5V)
T&H
+V_S
Timing Circuitry
14-Bit
Pipelined
ADC
Core
Error
Correction
Logic
DV
CLK
CLK
D0
3-State
Outputs
•••
D13
Reference Ladder
and Driver
Reference and
Mode Select
REFT
V_REF SEL1 SEL2 REFB PD OE VDRV
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
www.ti.com
Copyright © 2002-2005, Texas Instruments Incorporated