English
Language : 

ADC101S021 Datasheet, PDF (1/23 Pages) Texas Instruments – Single Channel, 50 to 200 ksps, 10-Bit A/D Converter
ADC101S021
www.ti.com
SNAS307G – JULY 2005 – REVISED JANUARY 2014
ADC101S021 Single Channel, 50 to 200 ksps, 10-Bit A/D Converter
Check for Samples: ADC101S021
FEATURES
1
•2 Specified Over a Range of Sample Rates.
• 6-Lead WSON and SOT-23 Packages
• Variable Power Management
• Single Power Supply with 2.7V - 5.25V Range
• SPI™/QSPI™/MICROWIRE/DSP Compatible
APPLICATIONS
• Portable Systems
• Remote Data Acquisition
• Instrumentation and Control Systems
DESCRIPTION
The ADC101S021 is a low-power, single channel
CMOS 10-bit analog-to-digital converter with a high-
speed serial interface. Unlike the conventional
practice of specifying performance at a single sample
rate only, the ADC101S021 is fully specified over a
sample rate range of 50 ksps to 200 ksps. The
converter is based upon a successive-approximation
register architecture with an internal track-and-hold
circuit.
The output serial data is straight binary, and is
compatible with several standards, such as SPI™,
QSPI™, MICROWIRE, and many common DSP
serial interfaces.
The ADC101S021 operates with a single supply that
can range from +2.7V to +5.25V. Normal power
consumption using a +3.6V or +5.25V supply is 2.34
mW and 8.9 mW, respectively. The power-down
feature reduces the power consumption to as low as
2.6 µW using a +5.25V supply.
The ADC101S021 is packaged in 6-lead WSON and
SOT-23 packages. Operation over the industrial
temperature range of −40°C to +85°C is ensured.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2014, Texas Instruments Incorporated