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ADC0820-N_14 Datasheet, PDF (1/29 Pages) Texas Instruments – 8-Bit High Speed μP Compatible A/D Converter with Track/Hold Function
ADC0820-N
www.ti.com
SNAS529C – JUNE 1999 – REVISED MARCH 2013
ADC0820-N 8-Bit High Speed µP Compatible A/D Converter with Track/Hold Function
Check for Samples: ADC0820-N
FEATURES
1
•2 Built-In Track-and-Hold Function
• No Missing Codes
• No External Clocking
• Single Supply—5 VDC
• Easy Interface to All Microprocessors, or
Operates Stand-Alone
• Latched TRI-STATE Output
• Logic Inputs and Outputs Meet Both MOS and
T2L Voltage Level Specifications
• Operates Ratiometrically or with any
Reference Value Equal to or Less than VCC
• 0V to 5V Analog Input Voltage Range with
Single 5V Supply
• No Zero or Full-Scale Adjust Required
• Overflow Output Available for Cascading
• 0.3 in. Standard Width 20-Pin PDIP
• 20-Pin PLCC
• 20-Pin SOIC
KEY SPECIFICATIONS
• Resolution: 8 Bits
• Conversion Time
– 2.5 µs Max (RD Mode)
– 1.5 µs Max (WR-RD Mode)
• Low Power: 75 mW Max
• Total Unadjusted Error: ±½ LSB and ± 1 LSB
DESCRIPTION
By using a half-flash conversion technique, the 8-bit
ADC0820-N CMOS A/D offers a 1.5 µs conversion
time and dissipates only 75 mW of power. The half-
flash technique consists of 32 comparators, a most
significant 4-bit ADC and a least significant 4-bit
ADC.
The input to the ADC0820-N is tracked and held by
the input sampling circuitry eliminating the need for
an external sample-and-hold for signals moving at
less than 100 mV/µs.
For ease of interface to microprocessors, the
ADC0820-N has been designed to appear as a
memory location or I/O port without the need for
external interfacing logic.
Connection and Functional Diagrams
Figure 1. CDIP, PDIP,
and SOIC Packages (Top View)
Figure 2. PLCC Package
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1999–2013, Texas Instruments Incorporated