74ACT11656 Datasheet, PDF (1/11 Pages) Texas Instruments – OCTAL BUFFER/LINE DRIVER WITH PARITY CHECKER/GENERATOR AND 3-STATE OUTPUTS

74ACT11656
OCTAL BUFFER/LINE DRIVER
WITH PARITY CHECKER/GENERATOR AND 3ĆSTATE OUTPUTS
SCAS460A − DECEMBER 1994 − REVISED APRIL 1996
D Inputs Are TTL-Voltage Compatible
D Combines ’244 and ’280 Functions In
One Package
D Flow-Through Architecture Optimizes
PCB Layout
D Center-Pin V_CC and GND Configurations
Minimize High-Speed Switching Noise
D EPIC  (Enhanced-Performance Implanted
CMOS) 1-µm Process
D 500-mA Typical Latch-Up Immunity at
125°C
description
The 74ACT11656 contains eight noninverting
buffers with 3-state outputs and a 9-bit parity
generator/checker. The device is intended for
bus-oriented applications.
DW PACKAGE
(TOP VIEW)
Y1 ₁
Y2 ₂
Y3 ₃
Y4 4
Y5 5
GND 6
GND 7
GND 8
GND 9
Y6 10
Y7 11
Y8 12
ΣE 13
ΣO 14
28 ^OE1
27 ^OE2
26 ^OE3
25 A1
24 A2
23 A3
22 V_CC
21 V_CC
20 A4
19 A5
18 A6
17 A7
16 A8
15 PI
When data is transmitted, the parity input (PI) terminal is configured as an input and combined with the A-input
data to generate a flag on either parity output (ΣE or ΣO) terminal, depending on the number of inputs that are
high.
The output-enable (OE1, OE2, and OE3) inputs can be used to disable the device so that the buses are
effectively isolated.
The 74ACT11656 is characterized for operation from −40°C to 85°C.
OE1
L
L
H
X
X
FUNCTION TABLES
INPUTS
OUTPUT
OE2 OE3 A
Y
L
L
L
L
L
L
H
H
X
X
X
Z
H
X
X
Z
X
H
X
Z
NO. OF INPUTS HIGH
(PI, A1−A8)
EVEN 0, 2, 4, 6, 8
ODD 1, 3, 5, 7, 9
Any OE = high
PARITY
OUTPUTS
ΣE ΣO
H
L
L
H
Z
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright  1996, Texas Instruments Incorporated
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